The laboratory is equipped with two darkened probe-stations for testing bare optoelectronic chips.
Conventional instrumentations consist of a 3 GHz class measurement chain, composed of a digital oscilloscope and a pulse/pattern generator. Two Agilent semiconductor analyzers and a high resolution LCR meter are available for the electrical characterization of semiconductors.
For conventional and quantum applications the optical instrumentation consists of a shared (with other labs) range of detectors for SWIR NIR and visible. SPAD photon counters for SWIR, NIR and visible. Fiber lasers, telecom power, with laser controller. Light transfer is usually done with fibers.
Multichannel counters and pulse cross-correlators down to 1.3 ns bin width, and Time to Digital converters with 70 ps resolution are available.
The laboratory is equipped with:
Optomechanical Components: Suss MicroTech PM8 probe station. Alessi Rel-3200 probe station. 2x Optical tables
Electronics: Agilent Technologies B1500A semiconductor parameter analyser. Hewlett Packard 4145A semiconductor parameter analyser. Hewlett Packard 4284A precision LCR meter. Stanford Research Instruments SR430 multichannel scaler. Ortec Easy MCS multichannel scaler. Tektronix AFG 3252 dual channel arbitrary function generator. LeCroy 7300A 3 GHz oscilloscope. Falco system WMA-300 DC-5 MHz broad-band high voltage amplifier. Keithley 6485 Picoammeter
Optics: Princeton Instruments Spectra-Pro 2300i grating imaging monochromator. Princeton Instruments Spec-10 256E CCD visible camera. Princeton Instruments OMA V InGaAs 1024 infrared CCD camera. Ocean Optics PQ600-2-VIS-BX fiber bunch.
Detectors: Perkin Elmer SPCM-AQRH 16 single photon counting module. ID Quantique ID201 single photon detection module. UDT Sensors PIN-10DF large area p-i-n photodiode.
Misc: Multimeter, voltage and current sources.